Open Technology Forum

Day 1 - Tuesday 22 June 2010

Test Automation in Real and Simulated Environments

The lingua franca for storing measurement data
Andreas Haub, managing director, National Instruments Engineering

Model-based testing for hardware-in-the-loop
Anthony Faucogney, business developer, ALL4TEC

Increase overall development and test efficiency by integrating PLM and testing using the example of PTC Windchill and AVL TFMS
Gerald Sammer, global product manager, AVL List GmbH

Requirements for standard compliant electrical test authoring in manufacturing applications
Alfons Schulte, sales manager, DSA Daten- und Systemtechnik GmbH

ODX-based testing with OTX
Ralf Ramrath, In2Soft

ASAM standards and electro-mobility
Jochen Thym, consultant and Frank Müller, business manager of the Bundesverband eMobilität (BEM eV)

Simulation /Hardware in the Loop

Creating real-time test applications with a configuration based testing platform
Balazs Toth, system engineer, National Instruments Engineering

New possibilities in real-time simulation at the testbed
Karan Bansal, product manager assistant

Combining two worlds: precise real-time-based and convenient PC-based testing
Rainer Rasche, dSPACE GmbH

High dynamic e-motor-HiL testing: PC-based vs. FPGA
Wolfgang Eismann, group leader, ETAS GmbH

Smart HIL testing
Bernd Albert, manager strategic marketing, Vector Informatik GmbH

Real-time measurements as precondition for realistic testbed tests
Rüdiger Teichmann, software development engineer, AVL List GmbH

Experience report: software quality assurance for vehicle programming
Michel Loubaresse, global business segment manager, Istec GmbH

Diagnostic simulation – opportunity and challenges
Frank Oswald, software engineer, Softing AG

Eberspächer tool-chain for remaining bus simulation, gateways and signal manipulation
Olaf Schmidt, key account manager, Eberspächer Electronics GmbH & Co

NVH challenges in the context of eco-engineering
Wilfried Claes, product manager, marketing manager, LMS International