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Open Technology Forum

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of the Open Technology Forum

Tuesday 6 May 2008

Day 1 - DATA ACQUISITION AND ANALYSIS

09.30
Crash discrimination with crash impact sound sensing (CISS)
Ingolstadt University of Applied Sciences (IAF), Christian Lauerer, Research Assistant
 

09.55
Standards and Approaches for Ball Joint Durability Testing

MTS Systems Corporation, Eric Little, Senior Applications Engineer

 

10.20
Fast and broadbanded car interior panel noise contribution analysis

Microflown Technologies BV, Oliver Wolff, Acoustic Consultant

 

10.45
Vibration analysis with High Speed Image Correlation

Dantec Dynamics GmbH, Jörg Collrep, Director of Sales

 

11.10
Acquisition of deformational behaviour of engine components and exhaust systems due to thermal expansion and dynamic mechanical load

GOM GmbH, Oliver Erne, Product Manager

 
 

11.35
The Use of Decibels and Loudness in the Assessement of Squeak & Rattle in Vehicles
Applus+ IDIADA, Juan J. Garcia, Manager NVH

 

12.00
How a Combustion Analysis System can support ECU calibration
D2T, Thierry Drecq, Product Manager

 

12.25
Diagnosing Root Causes and Resolving Communications Related Issues
Agilent Technologies, Cary Brown, Technical Marketing

 

EVALUATION AND ANALYSIS SOFTWARE

12.50
ODS Data Management with Famos 6.0

imc Meßsysteme GmbH, Ralf Winkelmann, International Sales Manager
 
 

13.15
Powerful Test Data Analysis using ASAM ODS

nCode International Ltd., Stephan Vervoort, Senior Application Engineer

 

13.40
Enterprise Services: The next Generation of Data Postprocessing with jBEAM 5.0

AMS GmbH, Dr. Bernhard Sünder, Managing Director

 

SIMULATION AND HIL TESTING TECHNOLOGY

14.05
CRUSADER – A full vehicle integration facility

Continental, VDO Automotive AG Jürgen Röder, Test Engineer, Integration Platforms
 

14.30
ECU-Diagnostics in HIL Applications

dSPACE GmbH, Dr. Jobst Richert, Section Manager Software Development

 

14.55
Reuse of Hardware Independent Test Sequences across MiL-, SiL-and HiL-Test Scenarios

Berner & Mattner Systemtechnik GmbH, Balázs Tóth, Technical Presale Engineer

 

15.20
Auto-generated remaining bus simulations based on a FIBEX description file

TZ Mikroleketronik, Felix Rembor, Application Engineer

 
15.45
Challenges of Cluster Simulation for FlexRay Systems

Elektrobit Dr. Dietmar Millinger, Director BUS Tools
 
16.10
Early Robustness Validation of Automotive FlexRay Topologies through a Simulation based Method

Synopsys GmbH, Thorsten Gerke, Technical Marketing Saber Products Europe
 
16.35
Pre-crash Test Capabilities in the VeHIL Facility

TNO, Niels Schouten, Business Developer
 

Automotive Testing Expo North America 2008

Automotive Testing Expo China 2008
Automotive Testing Expo Europe 2009
Automotive Testing
Technology International

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